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Machine Building 2009
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Data collection made simple
December 15th 2006

SKF says its Microlog Analyzer GX-E portable data collection system enables maintenance engineers to monitor simply and accurately the condition of a diverse range of rotating equipment. The handheld unit has been designed for the field-based collection of data, from vibration signal and process variables to bearing assessments, to ensure machinery continues to operate at optimum performance levels and maintenance costs are minimised.

Designed for ease of use, with a large colour display, responsive action, and a minimum of user configuration settings. The device is able to select the optimum data acquisition settings, such as ICP, auto-triggering and machine speed selection.

A modular design means it can be upgraded as maintenance engineers’ asset monitoring needs evolve. The unit can be converted to a GX-M model with Two Channel and Balancing modules installed, or a GX-S model through the addition of Bump Test and Data Recorder modules. SKF says this generates significant cost savings for operators, removing the need to replace instruments as their requirements change.

The GX-E forms a complete condition monitoring system when used with its accompanying simple to use and quick to install PC-based software, which allows engineers to carry out detailed analysis of the data collected in the field, and to produce comprehensive reports easily.

According to the company the Analyzer enables extremely fast and accurate data collection, utilising both digital signal processing (DSP) and a high resolution Sigma-Delta A/D converter. The instrument incorporates a 400 MHz X-Scale Intel® microprocessor and a Motorola DSP processor for added power and functionality, allowing the GX-E to outperform previous Microlog models’ data acquisition times by up to 50%. It also has a data storage capacity of 64MB flash memory for internal storage, and features flash and Secure Digital (SD) memory expansion slots enabling almost limitless data storage possibilities.

For further information, just  click here.

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