Test contactor series extended
08 June 2021
THE Y-RED test contactor series from Yamaichi Electronics is growing. In addition to IC chip evaluation and validation, the focus is now on failure analysis applications and low inductance laboratory measurements.
The result of decades of experience in designing full and semi-custom test contactors, the Y-RED combines high-grade technology and standardised single parts with simplified, user-friendly mounting procedure.
The new Y-RED test contactor is designed for sensory failure analysis (FA). Through an opening in the lid, the entire component is now visible during testing. An inlaid scratch and crack-resistant glass plate with a very wide transmission curve ensures uniform pressure distribution during contacting. These are features to perform chip analysis with Solid Immersion Lens and Emission Microscopy.
For DUT package sizes between 1.5 mm x 1.5 mm and 5 mm x 5 mm, a smaller version is also available for both the Y-RED EV and the new FA test contactor.