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New sound and vibration suite
25 January 2013
National Instruments has announced the latest version of its NI Sound and Vibration Measurement Suite software, which provides a comprehensive collection of analysis and signal processing tools for noise, vibration and

National Instruments has
announced the latest version of its
NI Sound and Vibration
Measurement Suite software, which
provides a comprehensive collection
of analysis and signal processing
tools for noise, vibration and
harshness (NVH) testing, machine
condition monitoring (MCM) and
audio test applications.
Engineers can use the suite as stand-alone software or combine it with NI hardware and NI LabVIEW system design software to simplify test system development and control.
With its new vibration data-logging functionality and other enhancements, the Sound and Vibration Measurement Suite 2011 is designed to help engineers to more easily customise and automate any MCM or NVH test or monitoring application.
"The NI Sound and Vibration Measurement Suite is an integral part of our MCM applications," said Professor Jay Lee, director of the National Science Foundation's Industry/University Cooperative Research Center for Intelligent Maintenance Systems at the University of Cincinnati. "The suite has reduced system development time and has helped us achieve a variety of efficiencies throughout our machine analysis process." New features include a ready-torun data-logging virtual instrument that makes it possible for engineers to save data continuously or based on specific criteria, such as triggers or time.
Engineers can use the suite as stand-alone software or combine it with NI hardware and NI LabVIEW system design software to simplify test system development and control.
With its new vibration data-logging functionality and other enhancements, the Sound and Vibration Measurement Suite 2011 is designed to help engineers to more easily customise and automate any MCM or NVH test or monitoring application.
"The NI Sound and Vibration Measurement Suite is an integral part of our MCM applications," said Professor Jay Lee, director of the National Science Foundation's Industry/University Cooperative Research Center for Intelligent Maintenance Systems at the University of Cincinnati. "The suite has reduced system development time and has helped us achieve a variety of efficiencies throughout our machine analysis process." New features include a ready-torun data-logging virtual instrument that makes it possible for engineers to save data continuously or based on specific criteria, such as triggers or time.
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