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Designed for high precision measurements

25 January 2013

Single axis MEMS (Micro-Electro- Mechanical Systems) capacitive accelerometers have been launched by Kistler Instruments for use where high-precision, low-frequency measurements and compact, robust construction are abso

Single axis MEMS (Micro-Electro- Mechanical Systems) capacitive accelerometers have been launched by Kistler Instruments for use where high-precision, low-frequency measurements and compact, robust construction are absolute requirements. The new accelerometers use Kistler's K-Beam technology to deliver precision, sensitivity and low noise characteristics.

The Type 8315A series is made up of six models with measurement rages from ±2 to ±200g with a frequency response of zero to 1000 Hz (5%) in a compact design with a footprint of just 25.4 mm. The MEMS variable capacitance sensing element consists of a small inertial mass located between two parallel plates. Deflection of the inertial mass under acceleration causes a proportional change in the capacitance of the sensing element.

An integrated analogue signal conditioner converts this change to a proportional voltage output. The thermal stability of the MEMS construction provides reliable performance within the operating temperature range of -55 to 125°C.
 
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